Automatic Test Equipment Block Diagram

The fundamental task of an ate is to.

Automatic test equipment block diagram.

With many ate s limited to testing just a single system training personnel and maintaining user knowledge for the multiple ate s required time that. The driver features three active modes. Ate 2 emory nalog ommuni cations igh speed busses igital embedded. Tida 01050 schematic and block diagram.

The advantages of this kind of testing include reducing testing time repeatability and cost efficiency in high volume. Atpg acronym for both automatic test pattern generation and automatic test pattern generator is an electronic design automation method technology used to find an input or test sequence that when applied to a digital circuit enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. Automatic test equipment ate industrial controls monitoring. Automated test equipment ate is computer controlled test and measurement equipment that allows for testing with minimal human interaction.

Adcs dacs codecs plls ramdac fire wire fibre channel ethernet. Dram flash sram audio video comm. An ate can be a simple computer controlled digital multimeter or a complicated system containing dozens of complex. Quad high voltage isolated analog switch array.

Background of the invention. Automatic test equipment components consists of. Automatic test equipment or automated test equipment ate is any apparatus that performs tests on a device known as the device under test dut equipment under test eut or unit under test uut using automation to quickly perform measurements and evaluate the test results. High low and terminate as well as a high impedance inhibit state.

Ate system block diagram digital master sequencer digital master sequencer synchro pipe dual master clock dual master clock awg. This design is applicable to any ate system but most applicable to systems requiring a large number of input channels. Automatic test equipment tutorial videos maintaining proficiency and upkeep on multiple automated test stand systems in order to test different systems and subsystems consumes many man hours. Powerful computer powerful 32 powerful 32 bit bit digital signal processor dsp for analog testing test program written in high test program written in high level level language running on the computer probe head actually touches the bare or packaged chip to perform fault detection.

Cpc7524 block diagram. The inhibit state in conjunction with the integrated dynamic clamps facilitates significant attenuation of transmission line reflections when the driver is not actively terminating the line. The tested devices are referred to as a device under test dut. This invention relates generally to an automatic test equipment employing an open architecture software framework and methods related thereto.